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PowerPoint Presentation
File Format: PDF/Adobe Acrobat - View as HTML KLA-Tencor ASET F-5 system. 2. Therma Wave Optiprobe 3260 system. I. Thin Film Thickness Measurements. 1. HRP (200 mm): KLA-Tencor. 2. Vx (200 mm): Veeco ...
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Microsoft PowerPoint - SKW5-ICP-K.ppt
File Format: PDF/Adobe Acrobat - View as HTML SKW 5-ICP-K Mask Floor Plan. SKW Associates, Inc,. 3370 Victor Court. Santa Clara, CA 95054. Phone (408) 919-0094. Fax (408) 919-0097 ...
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SKW 6-3BD V3.0 Uncapped Black Diamond Wafer Specifications
File Format: PDF/Adobe Acrobat - View as HTML SKW Associates, Inc. 3370 Victor Court. Santa Clara, CA 95054. Phone: (408) 919-0094 .... +/- 10 µm. Die Size: Y. 20 mm. +/- 10 µm. Vertical Die Spacing ...
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SKW Associates, Inc.
New W Plug Patterned 200mm Wafer (SKW 5-RSAX), June 2008. >> More... New 200mm Cu test patterned wafer (SKW6-6), September 2006. >> More. ...
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SKW Associates, Inc.
In order to investigate pattern dependency of CMP process, "standard" test patterned wafters are important to characterize CMP Process. ...
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SKW Associates, Inc.
New STI CMP Patterned 200mm and 300mm wafers (SKW 3-9), January 2008. >> More... New W Plug Patterned 200mm Wafer (SKW 5-RSAX), June 2008. >> More. ...
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Microsoft PowerPoint - SKW5-ICP-K.ppt
File Format: PDF/Adobe Acrobat - View as HTML SKW 5-ICP-K Mask Floor Plan. SKW Associates, Inc,. 3370 Victor Court. Santa Clara, CA 95054 ... SKW 5-ICP-K Wafer. Specifications. Rev. DATE: Nov 1, 2004 ...
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Microsoft PowerPoint - SKW5-ICP-K.ppt
File Format: PDF/Adobe Acrobat - View as HTML SKW 5-ICP-K Mask Floor Plan. SKW Associates, Inc,. 3370 Victor Court. Santa Clara, CA 95054 ... SKW 5-ICP-K Wafer. Specifications. Rev. DATE: Nov 1, 2004 ...
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DAISY CHAIN PACKAGING DEVELOPMENT PATTERNED WAFER PROCESS FLOW
File Format: PDF/Adobe Acrobat - View as HTML Daisy Chain Packaging Process Development Test Patterned. Wafer Products. A. Flip Chip. 1. 6L Flip Chip. -LXA0406. -LXA0437. -LXA0447. -LXA0607 ...
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SKW Associates, Inc.
Particularly in the case of wafers with very find features(e.g. 0.13 mm) for 900nm technology node, E-testing is essential for precise evaluation of CMP ...